CIE x048-PO17

CIE x048-PO17

Click here to purchase

The method for estimating the illuminance distribution in the vertical plane of museum objects (paintings) using a digital imaging luminance meters (ILMD) is considered. In order to pass from the luminance distribution to the illuminance distribution, a screen with reflective properties close to diffuse (Lambert) reflection is used. The theoretical and experimental uncertainty estimation of the measurement method done.

Product Details

Published:
09/29/2021
Number of Pages:
9
File Size:
1 file , 1.7 MB
Note:
This product is unavailable in Belarus, Russia, Ukraine

You may also like

CIE ISO 23539:2023

CIE ISO 23539:2023

Photometry - The CIE system of physical photometrystandard by Commission Internationale de L'Eclairage, 2023

CIE 251:2023

CIE 251:2023

LED Reference Spectrum for Photometer Calibrationstandard by Commission Internationale de L'Eclairage, 01/01/2023

CIE x049-P13

CIE x049-P13

IMPACT OF SAMPLING RATE ON FLICKER METRIC CALCULATIONSConference Proceeding by Commission Internationale de L'Eclairage, 10/01/2022

CIE x049-P08

CIE x049-P08

FIELD MEASUREMENT OF TLM QUANTITIES IN LIGHTING SCENARIOSConference Proceeding by Commission Internationale de L'Eclairage, 10/01/2022

Back to Top