STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITSstandard by JEDEC Solid State Technology Association, 04/01/2011

Graphics Double Data Rate (GDDR6) SGRAM Standardstandard by JEDEC Solid State Technology Association, 07/01/2017

ACCELERATED MOISTURE RESISTANCE - UNBIASED AUTOCLAVEstandard by JEDEC Solid State Technology Association, 11/01/2010

THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR SHORT-CIRCUIT FORWARD CURRENT TRANSFER RATIOstandard by JEDEC Solid State Technology Association, 02/01/1970

ADDENDUM No. 5 to JESD24 - SINGLE PULSE UNCLAMPED INDUCTIVE SWITCHING (UIS) AVALANCHE TEST METHODAmendment by JEDEC Solid State Technology Association, 08/01/1990

TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALSstandard by JEDEC Solid State Technology Association, 03/01/2018

Descriptive Designation System for Semiconductor-device Packagesstandard by JEDEC Solid State Technology Association, 08/01/2017

Universal Flash Storage (UFS) Teststandard by JEDEC Solid State Technology Association, 07/01/2017

TEMPERATURE CYCLINGstandard by JEDEC Solid State Technology Association, 03/01/2009

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTINGstandard by JEDEC Solid State Technology Association, 01/01/1993

HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)standard by JEDEC Solid State Technology Association, 11/01/2010

POD135 - 1.35 V PSEUDO OPEN DRAIN I/Ostandard by JEDEC Solid State Technology Association, 07/01/2010