IEC 62374 Ed. 1.0 b:2007
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric filmsstandard by International Electrotechnical Commission, 03/29/2007
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric filmsstandard by International Electrotechnical Commission, 03/29/2007
Corrigendum 1 - Medical electrical equipment - Part 2-35: Particular requirements for the basic safety and essential performance of heating devices usign
Organic light emitting diode (OLED) panels for general lighting - Safety requirementsstandard by International Electrotechnical Commission, 09/25/2014
Amendment 1 - Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 2: Modular multilevel
Radiation protection instrumentation - Passive integrating dosimetry systems for environmental and personal monitoring - Part 1: General characteristics and performance requirements standard
Digital addressable lighting interface - Part 216: Particular requirements for control gear - Load referencing (device type 15)standard by International Electrotechnical Commission,
Methods of measuring performances of electric hair clippers or trimmers for household usestandard by International Electrotechnical Commission, 08/16/2017
Lightning protection system components (LPSC) - Part 3: Requirements for isolating spark gaps (ISG)standard by International Electrotechnical Commission, 02/10/2012
Secondary lithium-ion cells for the propulsion of electric road vehicles - Part 3: Safety requirements standard by International Electrotechnical Commission, 08/29/2016
Internet protocol (IP) and transport stream (TS) based service access (TA1)standard by International Electrotechnical Commission, 12/15/2010
Nuclear power plants - Instrumentation and control important to safety - Resistance temperature detectors standard by International Electrotechnical Commission, 05/15/2007
Digital load side transmission lighting control (DLT) - Part 1: Basic requirementsstandard by International Electrotechnical Commission, 05/27/2015