IEC 62435-2 Ed. 1.0 b:2017
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanismsstandard by International Electrotechnical Commission, 01/24/2017
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanismsstandard by International Electrotechnical Commission, 01/24/2017
Medical device software - Software life cycle processes CONSOLIDATED EDITIONstandard by International Electrotechnical Commission, 06/26/2015
High density recording format on CD-R/RW disc systems - HD-BURN formatstandard by International Electrotechnical Commission, 06/24/2005
High-voltage switchgear and controlgear - Part 111: Automatic circuit reclosers and fault interrupters for alternating current systems up to 38 kVstandard by
Power losses in voltage sourced converter (VSC) valves for high-voltage direct current (HVDC) systems - Part 1: General requirementsstandard by International Electrotechnical
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the usestandard by International
Ferrite cores - Dimensions - Part 11: EC-cores for use in power supply applications standard by International Electrotechnical Commission, 11/18/2015
Electric motor-operated hand-held tools, transportable tools and lawn and garden machinery - Safety - Part 2-10: Particular requirements for hand-held mixersstandard by
Video recording - 12,65 mm Type D-11 format - Part 2: Picture compression and data streamstandard by International Electrotechnical Commission, 11/07/2003
Maritime navigation and radiocommunication equipment and systems - Class B shipborne equipment of the automatic identification system (AIS) - Part 1: Carrier-sense
Device embedded substrate - Part 1-1: Generic specification - Test methodsstandard by International Electrotechnical Commission, 05/20/2015
Electric motor-operated hand-held tools, transportable tools and lawn and garden machinery - Safety - Part 1: General requirementsstandard by International Electrotechnical Commission,